Publication | Closed Access
Electromigration stress induced deformation mechanisms in free-standing platinum thin films
24
Citations
12
References
2011
Year
Materials ScienceElectromigration TechniqueEngineeringSevere Plastic DeformationDislocation InteractionMechanical EngineeringApplied PhysicsSurface ScienceElectromigration StressThin Film Process TechnologyThin FilmsThin Film Processing
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