Magnetically Excited Plasma Oxidation of Si

Abstract

High-quality Si dioxide was successfully grown at room temperature using a magnetically excited plasma oxidation technique. Helicon waves were probably excited under the growth conditions used. Excellent capacitance-voltage characteristics were obtained after annealing of these oxide films in oxygen ambient for 15 min at 300°–500°C. The growth rate was somewhat low. However, the film thickness increased substantially with annealing. X-ray photoelectron spectroscopic studies indicated that high-quality Si oxides without suboxides were grown even at room temperature.