Concepedia

Characterization of Te/Zn/Te … multilayers deposited by RF-sputtering

H. Bellakhder, F. Debbagh, A. Outzourhit, A. Bennouna, M. Brunel, E.L. Ameziane

Solar Energy Materials and Solar Cells · 1997 · 10 citations · 8 references

DOI

Concepts

References

8

X-ray diffraction procedures

Harold P. Klug, Leroy Alexander · CERN Document Server (European Organization for Nuclear Research) · 1954 · 4.2K citations

Some optical properties of evaporated zinc telluride films

Umapada Pal, Suman Saha, A. K. Chaudhuri et al. · Journal of Physics D Applied Physics · 1989 · 74 citations

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Photoluminescence properties of MOVPE grown ZnTe layers on (100) GaAs and (100) GaSb

Hans Wägner, W. Kühn, W. Gebhardt · Journal of Crystal Growth · 1990 · 70 citations

, , +14

Growth and characterization of high-quality CdTe epilayers on GaAs substrates by hot-wall epitaxy

H. Sitter, K. Lischka, W. Faschinger et al. · Journal of Crystal Growth · 1988 · 36 citations

, , +12

The influence of thickness and index inhomogeneities on the transmission of semiconductor thin films

A. Bennouna, Yassin Laaziz, Malika Idrissi · Thin Solid Films · 1992 · 33 citations

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