Making risk minimization tolerant to label noise - Concepedia

Concepedia

Publication | Open Access

Making risk minimization tolerant to label noise

DOI Full Paper Access

225

Citations

36

References

2015

Year

Aritra Ghosh, Naresh Manwani, P. S. Sastry

EngineeringMachine LearningUncertainty QuantificationRisk ManagementKnowledge DiscoveryManagementNoiseNoisy DataRisk AnalysisComputer ScienceRisk Minimization TolerantSupervised Learning

References

	Year	Citations

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