Publication | Closed Access

Dual EMAT and PEC non-contact probe: applications to defect testing

Electrical EngineeringDual EmatEngineeringElectronic InstrumentationNondestructive TestingMeasurementCalibrationEducationElectronic PackagingInstrumentation EngineeringInstrumentationDesign For TestingNon-contact SensingElectromagnetic CompatibilityMicroelectronics