Publication | Closed Access
High-resolution X-ray diffraction by end of range defects in self-amorphized Ge
17
Citations
20
References
2008
Year
Materials ScienceEngineeringX-ray DiffractionCondensed Matter PhysicsApplied PhysicsHigh-resolution X-ray DiffractionDefect FormationAmorphous SolidRange DefectsDefect ToleranceSelf-amorphized Ge
| Year | Citations | |
|---|---|---|
Page 1
Page 1