Publication | Open Access
<i>Ab initio</i>estimate of temperature dependence of electrical conductivity in a model amorphous material: Hydrogenated amorphous silicon
46
Citations
42
References
2007
Year
EngineeringTemperature DependenceElectrical ConductivityDc ConductivitySilicon On InsulatorThermal ConductivitySemiconductor DeviceNanoelectronicsThermodynamicsThermal ConductionCharge Carrier TransportElectrical EngineeringPhysicsThermal AveragingSemiconductor MaterialMicroelectronicsElectrical PropertyApplied PhysicsCondensed Matter PhysicsAmorphous SiliconAmorphous SolidElectrical Insulation
We present an ab initio calculation of the dc conductivity of amorphous silicon and hydrogenated amorphous silicon. The Kubo-Greenwood formula is used to obtain the dc conductivity, by thermal averaging over extended dynamical simulation. Its application to disordered solids is discussed. The conductivity is computed for a wide range of temperatures and doping is explored in a naive way by shifting the Fermi level. We observed the Meyer-Neldel rule for the electrical conductivity with ${E}_{\mathrm{MNR}}=0.06\phantom{\rule{0.3em}{0ex}}\mathrm{eV}$ and a temperature coefficient of resistance close to experiment for $a\text{\ensuremath{-}}\mathrm{Si}:\mathrm{H}$. In general, experimental trends are reproduced by these calculations, and this suggests the possible utility of the approach for modeling carrier transport in other disordered systems.
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