Publication | Closed Access
The application of the loop annealing technique to self diffusion studies in silicon
32
Citations
13
References
1974
Year
Electrical EngineeringEngineeringDiffusion ResistancePhysicsBias Temperature InstabilityApplied PhysicsSemiconductor Device FabricationElectronic PackagingSilicon On InsulatorMicroelectronicsDiffusion StudiesSilicon Debugging
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