Publication | Closed Access
Field Effect on an Illuminated Ge Surface and Investigation of the Surface Recombination Process
25
Citations
15
References
1957
Year
Capture ProbabilitiesOptical MaterialsEngineeringElectron-beam LithographySurface ConductancePhotovoltaicsSurface ProcessingChemical EngineeringPhotoelectric SensorIlluminated Ge SurfaceSurface ReconstructionMaterials ScienceElectrical EngineeringPhysicsSurface Recombination ProcessMicroelectronicsField EffectSurface CharacterizationSurface AnalysisSurface ScienceApplied PhysicsPhotoconductance MeasurementOptoelectronicsElectrical Insulation
Surface conductance, photoconductance, and field effect were measured in the Brattain-Bardeen ambient cycle on germanium surfaces etched with CP-4. From the surface-conductance measurement, values of surface potential were deduced, and from the photoconductance measurement, relative changes of surface recombination velocity were obtained. By analyzing the change of surface recombination velocity as a function of surface potential, dominant recombination centers with discrete levels were found near the center of the gap with a ratio of hole to electron capture probabilities of 9. The energy levels of these centers were found to be consistent with the field-effect data. In addition, the effect of a normal ac field upon an illuminated sample was examined. The results can be interpreted as a superposition of the changes in the photoconductance and the surface conductance due to the field-induced change in surface potential. This effect can be used to determine the value of trap energy and the ratio of capture probabilities to a greater degree of accuracy than can the surface recombination velocity. Possible other applications of the effect are discussed.
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