Publication | Closed Access
Microstructure and electric properties of the PZT thin films fabricated by ECR PECVD: the effects of an interfacial layer and rapid thermal annealing
12
Citations
11
References
1998
Year
Materials ScienceMaterials EngineeringPzt Thin FilmsEngineeringApplied PhysicsRapid Thermal AnnealingEcr PecvdThin FilmsMolecular Beam EpitaxyEpitaxial GrowthThin Film ProcessingElectrical Insulation
| Year | Citations | |
|---|---|---|
Page 1
Page 1