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High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

High-resolution Strain MappingX-ray SpectroscopyEngineeringPhysicsMicroscopyFull-profile AnalysisStrain LocalizationX-ray DiffractionApplied PhysicsBulk SamplesSynchrotron RadiationX-ray OpticMechanics Of Materials