Publication | Closed Access
Radiative and non-radiative tunnelling in glow-discharge and sputtered amorphous silicon
43
Citations
16
References
1979
Year
Electrical EngineeringPhotoluminescenceEngineeringPhysicsCrystalline DefectsNanoelectronicsMain Competitive MechanismSilicon DebuggingApplied PhysicsUndoped Glow-discharge A-siAmorphous SiliconRadiative LifetimesSemiconductor Device FabricationAmorphous SolidSilicon On InsulatorMicroelectronicsOptoelectronicsSemiconductor Device
Abstract Photoluminescence decay measurements are reported for doped and undoped glow-discharge a-Si, and for a-Si prepared by sputtering in a hydrogenated atmo-sphere. It is concluded that a distribution of radiative lifetimes is present, due either to non-crystalline disorder or to a donor-acceptor pair mechanism. The main competitive mechanism is tunnelling to defects.
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