Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1989 · 13 citations · 9 references
Natural SciencesMaterials ScienceOptical MaterialsOpticsPhotonicsElectro-optic EffectsNonlinear Optical MaterialsNonlinear OpticsOptical ResonatorsPhysical OpticsRefractive IndexFocusNonlinear RefractionNonlinear Refractive IndexNonlinear Wave RefractionOptical NonlinearityPassive Optical ResonatorsRefractionSelf-focusing
Passive optical limiting based on nonlinear refraction in a "thick" medium is analyzed using a simple model. In a tight focus geometry we found that the position of the sample with respect to the focal plane is an important parameter in the limiting characteristics of the device. In particular we have examined such characteristics in liquid CS2 using 300 ns pulses at 10.6 μm.
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High-sensitivity, single-beam n_2 measurements
Mansoor Sheik‐Bahae, A. A. Said, Eric W. Van Stryland · Optics Letters · 1989 · 2.6K citations · Full text
Optical limiting with semiconductors
Eric W. Van Stryland, Yi Wu, David J. Hagan et al. · Journal of the Optical Society of America B · 1988 · 220 citations · Full text
Optical switching and n2 measurements in CS2
William E. Williams, M. J. Soileau, Eric W. Van Stryland · Optics Communications · 1984 · 182 citations