Photoelectron spectroscopy of chromium-doped silicon cluster anions

Abstract

The photoelectron spectra of chromium-doped silicon cluster anions, CrSi-(n), were measured over the size range, n=8-12. Their vertical detachment energies were measured to be 2.71, 2.88, 2.87, 2.95, and 3.18 eV, respectively. Our results support theoretical calculations by Khanna, Rao, and Jena [Phys. Rev. Lett. 89, 016803 (2002)] which found CrSi12 to be an enhanced stability (magic) cluster with its chromium atom encapsulated inside a silicon cage and with its magnetic moment completely quenched by the effects of the surrounding cage.