Modification of photoionization mass spectrometer with synchrotron radiation as ionization source

Abstract

In this article we introduce a modification on ion optics of a reflectron time-of-flight mass spectrometer for the study of flame chemistry with synchrotron radiation as a continuous ionization source. A small bias voltage is used in the extraction region to simultaneously reduce the background ion signal, eliminate secondary ionization process caused by photoelectrons, increase the ion detection efficiency, and improve the mass resolution.