Publication | Closed Access
Effect of ITO electrode with different oxygen contents on the electrical characteristics of HfO x RRAM devices
39
Citations
11
References
2012
Year
Electrical CharacteristicsNon-volatile MemoryElectrical EngineeringEngineeringIto ElectrodeApplied PhysicsMemory DeviceSemiconductor MemoryMicroelectronicsElectrochemistryDifferent Oxygen Contents
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