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SWIFT XRT point spread function measured at the Panter end-to-end tests
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2004
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X-ray SpectroscopyEngineeringX-ray EmissionMeasurementPolycapillary OpticsX-ray ImagingX-ray TechnologyRadiation ImagingMirror ModuleHealth SciencesPhotometryPanter End-to-end TestsRadiometrySynchrotron RadiationRadio TelescopeHigh-energy AstrophysicsAstrophysicsCalibration DataX-ray Optic
The <i>SWIFT</i> X-ray Telescope (XRT) is designed to make astrometric, spectroscopic and photometric observations of the X-ray emission from Gamma-ray bursts and their afterglows, in the energy band 0.2 - 10 keV. Here we report the results of the analysis of <i>SWIFT</i> XRT Point Spread Function (PSF) as measured during the end-to-end calibration campaign at the Panter X-Ray beam line facility. The analysis comprises the study of the PSF both on-axis and off-axis. We compare the laboratory results with the expectations from the ray-tracing software and from the mirror module tested as a single unit. We show that the measured HEW meets the mission scientific requirements. On the basis of the calibration data we build an analytical model which is able to reproduce the PSF as a function of the energy and the position within the detector.