Solid-State Electronics · 1985 · 24 citations · 8 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingDopingP-n JunctionsSemiconductor Device MaterialsSemiconductor PhysicsBuilt-in PotentialDebye LengthDebye Screening LengthDiode Current-voltage CharacteristicsDiode ModelingDoping Effects On Device PerformanceElectron Debye LengthP-n Junction Characteristics
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