Publication | Closed Access
Quantitative assessment of beam perturbations caused by silicon diodes used for in vivo dosimetry
32
Citations
6
References
1996
Year
Radiation TestingVivo DosimetryEngineeringIon ImplantationMeasurementTreatment VerificationMedicineSilicon DiodesBeam PerturbationsDosimetryElectrophysiologyBiomedical EngineeringIon BeamInstrumentationMicroelectronicsNuclear MedicineRadiology
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