Nanosecond Breakdown in Liquid Dielectrics

Abstract

Measurements of nanosecond formative times in various liquids are summarized. The experiments utilized applied fields of up to 3.3×106 V/cm while equipment time resolution was on the order of 0.3 nsec. Detailed results are given for n-hexane including aging time histories and formative times with and without an applied bias field. The data obtained in this study are compared with earlier work. Using a simplified breakdown model the mobility of charge carriers at 2×106 V/cm is calculated to be 8.7×10−2 cm2/V·sec. The nanosecond high-voltage insulating qualities of various liquids are discussed.