Improved technique in electron stimulated desorption ion angular distributions

Abstract

An improved technique for the measurement of ion angular distributions of electron stimulated desorption (ESDIAD) has been developed. The use of a chopped electron beam in connection with a gated detector system significantly reduces the background in the ESDIAD patterns. A comparison of experimental data obtained with the improved scan and the conventional display technique is presented. The essential advantages of the new method are increased sensitivity, low background, high-angular resolution and ion energy determination at any desired point of the ESDIAD pattern.