Applied Physics Letters · 2004 · 40 citations · 9 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesThin FilmsDisplay TechnologiesLight-emitting DiodesOptical Thin FilmsOrganic SemiconductorsThin-film DepositionFlexible DisplaysLight-emitting DevicesLow-temperature DepositionOrganic Light-emitting DiodesPlasma-induced DamageReverse Bias CharacteristicsSputteringSputtering Techniques
We report on the fabrication of plasma damage-free organic light-emitting devices (OLEDs) by using a mirror shape target sputtering (MSTS) technique. It is shown that OLEDs with Al cathode deposited by the MSTS show much lower leakage current (1×10−5mA∕cm2) at reverse bias of −6V, compared to that (1×10−1–∼10−2mA∕cm2 at −6V) of OLEDs with Al cathodes grown by conventional dc magnetron sputtering. This indicates that there is no plasma damage, which is caused by the bombardment of energetic particles. This suggests that MSTS could be a useful plasma damage-free and low-temperature deposition technique for both top- and bottom-emitting OLEDs and flexible displays.
9
Organic electroluminescent diodes
Chak Wah Tang, S. A. VanSlyke · Applied Physics Letters · 1987 · 14.3K citations
Natural Sciences, Materials Engineering, Materials Science +17
Light-emitting diodes based on conjugated polymers
J. H. Burroughes, Donal D. C. Bradley, Adam R. Brown et al. · Nature · 1990 · 11.4K citations
Natural Sciences, Materials Engineering, Materials Science +12
Transparent organic light emitting devices
G. Gu, Vladimir Bulović, P. E. Burrows et al. · Applied Physics Letters · 1996 · 441 citations
Ion-beam-induced surface damages on tris-(8-hydroxyquinoline) aluminum
Liang‐Sheng Liao, L. S. Hung, Wai-Hung Chan et al. · Applied Physics Letters · 1999 · 88 citations