Complementary use of PIXE-alpha and XRF portable systems for the non-destructive and in situ characterization of gemstones in museums - Concepedia

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Complementary use of PIXE-alpha and XRF portable systems for the non-destructive and in situ characterization of gemstones in museums

30

Citations

7

References

2005

Year

L. Pappalardo, A. G. Karydas, N. Kotzamani, Giuseppe Pappalardo, Francesco Paolo Romano, Ch. Zarkadas

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Materials ScienceEngineeringComplementary UseXrf Portable SystemsChemistryAccessory MineralIndustrial MineralCrystallographySitu Characterization

References

	Year	Citations

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