Applied Physics Letters · 2010 · 128 citations · 15 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLight-emitting DiodesOptoelectronic DevicesOptoelectronic MaterialsQuantum DotsSemiconductor Device MaterialsSemiconductor PhysicsCurrent InjectionEfficiency DroopInternal Quantum EfficiencyMolecular Beam EpitaxyOptical PropertiesPhotoluminescenceQuantum EfficiencySemiconductor Quantum Dots
High density (2–5×1010 cm−2) self-organized InGaN/GaN quantum dots were grown by plasma-assisted molecular beam epitaxy. Room temperature photoluminescence shows that the quantum dots have strong emission ranging from 430 to 524 nm. The internal quantum efficiency of dots emitting at 500 nm was determined to be 32% by temperature dependent photoluminescence measurements. A recombination lifetime of 0.57 ns is derived from time resolved photoluminescence measurements. These superior optical properties are attributed to a small piezoelectric field in the quantum dots. Light emitting diodes fabricated with the InGaN/GaN quantum dots and emitting at λ=524 nm demonstrate a small blueshift with current injection and reduced efficiency droop.
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Origin of efficiency droop in GaN-based light-emitting diodes
Minho Kim, M. Schubert, Qi Dai et al. · Applied Physics Letters · 2007 · 1.3K citations · Full text
Engineering, Electrical Engineering, Materials Engineering +17
Auger recombination in InGaN measured by photoluminescence
Yinchu Shen, Gerd Mueller, Satoshi Watanabe et al. · Applied Physics Letters · 2007 · 1.1K citations
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