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Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Materials ScienceEngineeringChemical AnalysisAnalytical InstrumentationPolymer ScienceMass SpectrometryAnalytical ChemistryPolymer CharacterizationChemistryPolymer AnalysisTemperature-controlled Depth ProfilingSpectrochemical AnalysisPolymer ChemistryPolymeric MaterialsIon Mobility