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Tight-binding calculation of the properties of the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>F</mml:mi></mml:math>center and of isoelectronic defects in ZnS
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1976
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EngineeringComputational ChemistryDefect ToleranceElectronic StructureIi-vi SemiconductorMath XmlnsIsoelectronic DefectsQuantum MaterialsEnergy LevelsQuantum ScienceElectrical EngineeringPhysicsAtomic PhysicsDefect FormationQuantum ChemistryTight-binding ParametrizationAb-initio MethodTight-binding CalculationBand StructureNatural SciencesApplied PhysicsCondensed Matter Physics
Using a tight-binding parametrization of the band structure of ZnS, we calculate the energy levels of the $F$ center associated with a vacancy of S, and of some isoelectronic defects on Zn and S sites. The calculation is performed in a Koster-Slater scheme, using the Haydock, Heine, and Kelly recursion method to generate the Green's functions. The theoretical results agree reasonably well with the experimental data.
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