Atomic resolution HVEM and environmental noise

Abstract

Journal Article Atomic resolution HVEM and environmental noise Get access H. Ichinose, H. Ichinose Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo7-3-1 Hongo, Bunkyo-ku, Tokyo 113 Search for other works by this author on: Oxford Academic PubMed Google Scholar H. Sawada, H. Sawada Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo7-3-1 Hongo, Bunkyo-ku, Tokyo 113 Search for other works by this author on: Oxford Academic PubMed Google Scholar E. Takuma, E. Takuma Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo7-3-1 Hongo, Bunkyo-ku, Tokyo 113 Search for other works by this author on: Oxford Academic PubMed Google Scholar M. Osaki M. Osaki 1JEOL Co. Ltd1156 Nakagami, Akishima, 196-0022 Tokyo, Japan Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 48, Issue 6, 1999, Pages 887–891, https://doi.org/10.1093/oxfordjournals.jmicro.a023761 Published: 01 January 1999 Article history Published: 01 January 1999 Received: 31 August 1999 Accepted: 28 September 1999