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Spectroscopic ellipsometry studies on the optical constants of indium tin oxide films deposited under various sputtering conditions

Materials ScienceSurface CharacterizationIndium TinOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsSurface ScienceApplied PhysicsSpectroscopic Ellipsometry StudiesOptoelectronicsSpectroscopic PropertyThin Film ProcessingOptical Constants