Publication | Open Access
Static Proton and Heavy Ion Testing of the Xilinx Virtex-5 Device
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Citations
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References
2007
Year
Unknown Venue
Angular EffectsEngineeringNuclear PhysicsVlsi DesignHardware AlgorithmComputer ArchitectureIon Beam InstrumentationHardware SecurityXilinx Virtex-5 DeviceInstrumentationStatic ProtonElectrical EngineeringAccelerator Mass SpectrometryPhysicsMultiple-bit UpsetsHeavy Ion TestingStatic Bit Cross-sectionsComputer EngineeringReconfigurable ArchitectureSynchrotron RadiationMicroelectronicsFpga DesignHardware AccelerationNatural SciencesElectronic InstrumentationField-programmable Gate Arrays
This paper presents proton and heavy ion static results for the latest Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiple-bit upsets (MBUs) and angular effects.
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