Applied Physics Letters · 2006 · 20 citations · 15 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOrganic ChemistryThin FilmsCrystal GrowthEpitaxial GrowthOptical Thin FilmsThin Film Optical PropertiesThin-film DepositionThin-film MaterialsEpitaxial Film GrowthFilm ThicknessFilm Thickness ControlMolecular Beam EpitaxyOptical AnisotropyOptical Monitoring Of Film GrowthReal-time MonitoringReflectance
In this letter the authors use the evolution of reflectance anisotropy spectra with film thickness during the growth of organic molecular films of a prototype molecular system (α-quarterthiophene grown onto a single crystal of the same material) to demonstrate homoepitaxy. The real time monitoring of the optical anisotropy of a thin film during deposition by organic molecular beam epitaxy is assessed as a powerful tool to achieve an effective in situ control of the growth starting from the very early deposition stages.
15
<i>Ellipsometry and Polarized Light</i>
R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations
Natural Sciences, Physics, Optics +13