Concepedia
Optics & Laser Technology · 2003 · 35 citations · 6 references
Natural SciencesMaterials ScienceCrystal StructureElectron DiffractionInterferometryMoire InterferometryPhase ShiftsPhase-shifting Holography
6
Automated phase-measuring profilometry: a phase mapping approach
V. Srinivasan, H. C. Liu, M. Halioua · Applied Optics · 1985 · 207 citations
Engineering, Manufacturing Engineering, Equipment +15
Microcreep deformation measurements by a moire method using electron beam lithography and electron beam scan
Satoshi Kishimoto · Optical Engineering · 1993 · 85 citations
Natural Sciences, Materials Engineering, Materials Science +17
High precision deformation measurement by digital phase shifting holographic interferometry
Ming Chang, Ching-Piao Hu, Philip Lam et al. · Applied Optics · 1985 · 46 citations
Natural Sciences, Materials Science, Digital Imaging +16
Scanning moiré at high magnification using optical methods
David T. Read, J. W. Dally, M. Szanto · Experimental Mechanics · 1993 · 40 citations
Natural Sciences, Physics, Digital Imaging +13
Quantitative strain analysis of flip-chip electronic packages using phase-shifting moiré interferometry
M.R. Miller, Ilyas Mohammed, Paul S. Ho · Optics and Lasers in Engineering · 2001 · 34 citations
Engineering, Electrical Engineering, Materials Science +16