Exploring Malicious Meter Inspection in Neighborhood Area Smart Grids

Zhifeng Xiao, Yang Xiao, David Hung-Chang Du

IEEE Transactions on Smart Grid · 2012 · 96 citations · 21 references

Concepts

Abstract

In smart grids, smart meters may potentially be attacked or compromised to cause certain security risks. It is challenging to identify malicious meters when there are a large number of users. In this paper, we explore the malicious meter inspection (MMI) problem in neighborhood area smart grids. We propose a suite of inspection algorithms in a progressive manner. First, we present a basic scanning method, which takes linear time to accomplish inspection. The scanning method is efficient when the malicious meter ratio is high. Then, we propose a binary-tree-based inspection algorithm, which performs better than scanning when the malicious meter ratio is low. Finally, we employ an adaptive-tree-based algorithm, which leverages advantages of both the scanning and binary-tree inspections. Our approaches are tailored to fit both static and dynamic situations. The theoretical and experimental results have shown the effectiveness of the adaptive tree approach.

References

21