Characterization of 1,1-Dihydroperfluorooctyl Acrylate (PFOA) by XPS

Abstract

A sample of 1,1-dihydroperfluorooctyl acrylate (PFOA), a low surface energy polymeric material prepared by homogeneous free radical solution polymerization in supercritical CO2, has been investigated by x-ray photoelectron spectroscopy (XPS) using a Perkin-Elmer Physical Electronics Model 5400 spectrometer with monochromatic Al Kα x rays. Knowledge of the surface composition of PFOA is significant since potential applications of this homopolymer include use in polymer blends where this material would be expected to be the surface active species. Controlled surface studies were conducted on a thick polymer film (∼0.5 μm) spun cast from solution onto silicon. Although the F 1s and O 1s regions were structurally straightforward to interpret, the C 1s window showed the expected pattern of functional group components.