Parametrization of C-shocks. Evolution of the sputtering of grains

Abstract

Context. The detection of narrow SiO line emission toward the young shocks of the L1448-mm outflow has been interpreted as a signature of the magnetic precursor of C-shocks. In contrast with the low SiO abundances (≤10-12) derived from the ambient gas, the narrow SiO emission in the precursor component at almost ambient velocities reveals enhanced SiO abundances of ~10-11. It has been proposed that this enhancement of the SiO abundance is produced by the sputtering of the grain mantles at the early stages of C-shocks. However, modelling of the sputtering of grains has usually averaged the SiO abundances over the dissipation region of C-shocks, which cannot explain the recent observations.