Conventional and high resolution TEM investigation of the microstructure of compositionally graded TiAlSiN thin films - Concepedia

Concepedia

Publication | Closed Access

Conventional and high resolution TEM investigation of the microstructure of compositionally graded TiAlSiN thin films

43

Citations

15

References

2004

Year

Magdalena Parlińska‐Wojtan, A. Karimi, T. Cselle, M. Morstein

Surface and Coatings Technology

Materials ScienceMaterial AnalysisEngineeringPhysicsTialsin Thin FilmsApplied PhysicsThin FilmsChemical Vapor DepositionDepth-graded Multilayer CoatingThin Film Processing

References

	Year	Citations

Page 1