Spatially and spectrally resolved electroluminescence measurement system for photovoltaic characterisation

Abstract

A system that combines the advantages of fast global electroluminescence (EL) imaging and detailed spectrally resolved EL measurements is presented. A charge‐coupled device camera‐based EL imaging system is used to measure the intensity of radiative recombination of the photovoltaic (PV) device spatially resolved over its full area. A monochromator‐based system is utilised to measure localised emission spectra at given points of interest. Measurements of multi‐crystalline and amorphous silicon PV devices demonstrate the potential to investigate radiative defects and reveal performance variations and non‐uniformities. This links inhomogeneities much closer to device physics than using camera‐based EL only.