Applied Physics Letters · 2002 · 166 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsDetector TechnologyOptical DetectorsPhotodetectorsPhotonic Integrated CircuitsSemiconductor DetectorsSemiconductor Device MaterialsDislocation DensityGermanium DetectorsGermanium PhotodetectorsIntegrated PhotodetectorsP-i-n PhotodetectorsSilicon DetectorsSilicon PhotodetectorsSilicon Photodiodes
We demonstrate fast and efficient germanium-on-silicon p-i-n photodetectors for optical communications, with responsivities as high as 0.89 and 0.75 A/W at 1.3 and 1.55 μm, respectively, time response <200 ps and dark currents as low as 1.2 μA. Ge was epitaxially grown on Si by chemical vapor deposition, employing a low temperature buffer and cyclic thermal annealing to reduce the dislocation density. The overall performance is well suited for >2.5 Gb/s integrated receivers for the second and third fiber spectral windows.
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