Epitaxial growth of M-type Ba-hexaferrite films on MgO (111)‖SiC (0001) with low ferromagnetic resonance linewidths

Abstract

Barium hexaferrite (BaM) films were deposited on 10nm MgO (111) films on 6H silicon carbide (0001) substrates by pulsed laser deposition from a homogeneous BaFe12O19 target. The MgO layer, deposited by molecular beam epitaxy, alleviated lattice mismatch and interdiffusion between film and substrate. X-ray diffraction showed strong crystallographic alignment while pole figures exhibited reflections consistent with epitaxial growth. After optimized annealing, these BaM films have a perpendicular magnetic anisotropy field of 16900Oe, a magnetization (as 4πMs) of 4.4kG, and a ferromagnetic resonance peak-to-peak derivative linewidth at 53GHz of 96Oe, thus demonstrating sufficient properties for microwave device applications.