Publication | Closed Access
Characteristics and radiation effects of MOS capacitors with Al2O3 layers in p-type silicon
19
Citations
6
References
1995
Year
Materials ScienceAl2o3 LayersElectrical EngineeringEngineeringNanoelectronicsOxide ElectronicsApplied PhysicsSemiconductor Device FabricationRadiation EffectsMicroelectronicsMos CapacitorsSilicon On InsulatorSemiconductor Device
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