Journal of Lightwave Technology · 2013 · 46 citations · 10 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsSemiconductor DevicesDetector EfficiencyDetector TechnologyOptical DetectorsPhotodetectorsSemiconductor DetectorsSilicon PhotonicsDetectorsPhoton CountingPhoton Counting DetectionPhoton DetectionQuantum EfficiencyRadiation Detection EfficiencySingle-photon Avalanche DiodesSingle-photon Detection
We characterize a new commercial, back-illuminated reach-through silicon single-photon avalanche photo diode (SPAD) SAP500 (Laser Components. Inc.), operated in Geiger-mode for purpose of photon counting. We show that for this sensor a significant interplay exists between dark counts, detection efficiency, afterpulsing, excess voltage and operating temperature, sometimes requiring a careful optimization tailored for a specific application. We find that a large flat plateau of sensitive area of about 0.5 mm in diameter, a peak quantum efficiency of 73% at 560 nm and timing precision down to 150 ps full-width at half-maximum are the main distinguishing characteristics of this SPAD.
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