Elimination of the Skin Effect Error in Heavy-Current Shunts

Abstract

A mathematical analysis of the transient skin effect in tubular and flat conductors has led to the development of a theory of ideal heavy-current shunts immune to the measuring error caused by this effect. A general expression was derived for calculating a profile of the measuring circuit laid inside the shunt wall that would give a step response undistorted by the skin effect. A model of the new shunt ws examined with a current step; the recorded response followed the applied pulse form.