Publication | Closed Access
The effect of randomness in the distribution of impurity atoms on FET thresholds
180
Citations
12
References
1975
Year
Impurity AtomsDefect ToleranceElectrical EngineeringEngineeringPhysicsIntrinsic ImpurityApplied PhysicsCondensed Matter PhysicsAtomic PhysicsFet ThresholdsDefect FormationMicroelectronics
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