Simultaneous measurements of As, Mo, Sb, V and W using a ferrihydrite diffusive gradients in thin films (DGT) device - Concepedia

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Simultaneous measurements of As, Mo, Sb, V and W using a ferrihydrite diffusive gradients in thin films (DGT) device

77

Citations

17

References

2010

Year

Heléne Österlund, Sara Chlot, Mikko Faarinen, Anders Widerlund, Ilia Rodushkin, Johan Ingri, Douglas C. Baxter

Analytica Chimica Acta

Materials ScienceSurface CharacterizationEngineeringFerrihydrite Diffusive GradientsSurface AnalysisSurface ScienceApplied PhysicsSemiconductor MaterialThin FilmsThin Film ProcessingSimultaneous Measurements

References

	Year	Citations

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