Concepedia

Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS

Melanie J. Bailey, Brian N. Jones, Steven J. Hinder, John F. Watts, Stephen M. Bleay, R.P. Webb

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2010 · 51 citations · 11 references

DOI

Concepts

References

11

Latent Fingerprint Chemical Imaging by Mass Spectrometry

Demian R. Ifa, Nicholas E. Manicke, Allison L. Dill et al. · Science · 2008 · 408 citations

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Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada et al. · Rapid Communications in Mass Spectrometry · 2009 · 103 citations

, , +15

The deposition of fingerprint films

B Scruton, B W Robins, B H Blott · Journal of Physics D Applied Physics · 1975 · 76 citations

, , +12

Development of a GC‐MS Method for the Simultaneous Analysis of Latent Fingerprint Components<sup>*</sup>

Ruth Croxton, Mark Baron, David Butler et al. · Journal of Forensic Sciences · 2006 · 71 citations · Full text

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ToF-SIMS application in the visualization and analysis of fingerprints after contact with amphetamine drugs

M. I. Szynkowska, K. Czerski, Jacek Rogowski et al. · Forensic Science International · 2008 · 66 citations · Full text

, , +12