USE OF AN ELLIPSOMETER TO DETERMINE SURFACE CLEANLINESS AND MEASUREMENT OF THE OPTICAL AND DIELECTRIC CONSTANTS OF InSb AT λ = 5461 Å

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation A. N. Saxena; USE OF AN ELLIPSOMETER TO DETERMINE SURFACE CLEANLINESS AND MEASUREMENT OF THE OPTICAL AND DIELECTRIC CONSTANTS OF InSb AT λ = 5461 Å. Appl. Phys. Lett. 1 September 1965; 7 (5): 113–114. https://doi.org/10.1063/1.1754331 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search