2002 · 14 citations · 1 references
EngineeringElectrical EngineeringNuclear EngineeringMicroelectronicsNuclear PhysicsSemiconductor DevicesMemory Subsystem DesignNeutron DetectionNeutron ScatteringNuclear FissionMemory TestNeutron Damage EffectsNeutron Irradiation EffectsNeutron SpectrometryNeutron Spectrum EffectsPower Supply Reliability
This paper presents the results of a SEE neutron evaluation carried out on five SRAM types. Sensitivity to the power supply, test pattern and memory cell structures were investigated.
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