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New superfast power closing switched-dynistors on delayed ionization
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2002
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Low-power ElectronicsPower Closing SwitchesElectrical EngineeringSemiconductor DeviceEngineeringPhysicsNanoelectronicsElectronic EngineeringApplied PhysicsPower Semiconductor DeviceNew Superfast PowerDelayed IonizationMicroelectronicsOptoelectronicsDevice ThicknessElectronic Circuit
The fastest from known semiconductor electrically triggered power closing switches have turn on times of dozens of nanoseconds at /spl sim/1 kV blocking voltage and /spl sim/100 A switching current. Any attempt to increase the device voltage leads to an increase of the device thickness and an increase of turn-on times. Spark gaps, although faster, have severely limited lifetimes. The effect of delayed ionization has allowed for the development of a new kind of power superfast switch-silicon avalanche shapers (SAS)-in which time of flight limitation on speed has bean overcome. This approach has been used to develop new power superfast devices-fast ionization dynistors (FID)-which behave like a thyristor in that they have two steady states: nonconducting; and high-conducting. The fast (less than 1 ns) transition from the nonconducting to high-conducting state is induced by delayed ionization by the application of a short (nanosecond) high-voltage (kilovolts) pulse to the blocking p-n junction of the multilayered n/sup +/pnp/sup +/ semiconductor structure. Due to regenerative feedback, as in usual thyristors, the structure remains in the high-conducting state infinitely. To switch on the device, it is necessary to break the current by using an external circuit.