Publication | Closed Access
Cryogenic study and modeling of IGBTs
40
Citations
19
References
2004
Year
Unknown Venue
Device ModelingElectrical EngineeringEngineeringCryogenic StudyPower DeviceNanoelectronicsSwitching CharacteristicsCryogenicsSuperconductivityApplied PhysicsBias Temperature InstabilityForward Conduction DropPower Semiconductor DeviceTemperature RangeHeat TransferPower ElectronicsMicroelectronicsSemiconductor Device
The switching characteristics (turn-on and turn-off) and forward conduction drop of trench-gate IGBTs are examined over a temperature range of -260 to 25/spl deg/C. A physics-based model previously developed is modified to incorporate appropriate physical behavior at low junction temperatures. Results from the model are compared to experimental waveforms and discrepancies are discussed.
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