Publication | Open Access

3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography

Materials ScienceSurface CharacterizationEngineeringPhysicsSurface AnalysisSurface ScienceApplied PhysicsCondensed Matter PhysicsDefect FormationAtom Probe TomographyThin FilmsDefect ToleranceThin Film CuThin Film Processing