Fermilab booster ion profile monitor system using LABVIEW

Abstract

The new Booster Ion Profile Monitor has been implemented to simultaneously capture both horizontal and vertical profiles at a once‐per‐turn sample rate, throughout a Booster cycle. The system uses LabVIEW software running on a MacIntosh Quadra 650 talking to both VME and CAMAC hardware. Microchannel plate voltage is turned on just prior to making a measurement and automatically turned off when the measurement is complete. This action allows using a high gain while preserving microchannel plate lifetime. The data captured may be archived for later analysis. Current analysis available include position, emittance/sigma, 2D color intensity plot of raw data, and single turn profiles for any turn during the cycle.